eng Nuclear Technology & Radiation Protection 31(3) Keywords: magnetic memory, semiconductor memory, radioactive reliability, gamma radiation, neutron radiation Ključne reči : magnetna memorija, poluprovodnička memorija, radioaktivna otpornost, gama zračenje, neutronsko zračenje Abstract: The aim of this paper is examining a radiation hardness of the magnetic (Toshiba MK4007 GAL) and semiconductor (AT 27C010 EPROM and AT 28C010 EEPROM) computer memories in the field of radiation. Magnetic memories have been examined in the field of neutron radiation, and semiconductor memories in the field of gamma radiation. The obtained results have shown a high radiation hardness of magnetic memories. On the other side, it has been shown that semiconductor memories are significantly more sensitive and a radiation can lead to an important damage of their functionality. Sažetak: U radu su prikazani rezultati ispitivanja radijacione otpornosti računarskih magnetnih (Toshiba MK4007 GAL) i poluprovodničkih (AT 27C010 EPROM i AT 28C010 EEPROM) memorija u polju radioaktivnog zračenja. Magnetne memorije ispitivane su u polju neutronskog, a poluprovodničke u polju gama zračenja. Dobijeni rezultati pokazali su visoku radijacionu otpornost ispitivanih magnetnih memorija. S druge strane, utvrđeno je da su poluprovodničke memorije znatno osetljivije i da radioaktivno zračenje može da dovede do značajnog oštećenja njihove funkcionalnosti. application/pdf 787991 bytes All rights reserved info:eu-repo/semantics/article https://phaidrabg.bg.ac.rs/o:29961 doi:10.2298/NTRP1603240F ISSN: 1451-3994 RELIABILITY OF COMPUTER MEMORIES IN RADIATION ENVIRONMENT POUZDANOST RADA RAČUNARSKIH MEMORIJA U RADIJACIONOM OKRUŽENJU 2016 Fetahović, Irfan S. Dolićanin, Edin Ć. Lončar, Boris B. Kartalović, Nenad M.